For　the　problem　of　reliability　in　the　long-term　use　of　integrated　circuit　chips,　this　article　aims　to　work　reliably　for　eight　years,　that　is,　after　eight　years　of　work,　all　devices　can　work　normally,　and　a　specific　assessment　plan　for　the　life　test　is　proposed.　In　this　paper,　a　physical　unclonable　function　chip　is　taken　as　an　example,　and　related　life-span　experiments　are　carried　out　for　the　reliability　target,　and　a　method　of　life　evaluation　of　a　physical　unclonable　function　chip　is　proposed.　This　method　of　evaluating　life　can　also　be　used　for　other　integrated　circuit　chips　or　components.　©　2022　SPIE.　All　rights　reserved.