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Author:

Chen Hongfang (Chen Hongfang.) | Zhang Shuang (Zhang Shuang.) | Liang Chaowei (Liang Chaowei.) | Tang Liang (Tang Liang.) | Shi Zhaoyao (Shi Zhaoyao.)

Abstract:

In this paper, a method for volume error calibration of a coordinate measuring machine (CMM) is proposed, which is based on the inverse-distance weighting (IDW) algorithm. The volume errors of the CMM spatial measurement points arc firstly obtained using the laser tracing multi-station measurement technique combined with the Levenberg-Marquardt (L-M) algorithm. Subsequently the (L-M) algorithm is used to spatially interpolate the volume errors of the measurement points and thus the volume error of any point in the whole measurement space of CMM is obtained. The experimental results show that the (L-M) algorithm has low requirements for measurement paths, high interpolation accuracy, and an error coincidence degree of higher than 96% for volume error in each direction. The research results provide a reference for the selection of the optimal measurement position for workpieces in the measurement space.

Keyword:

error compensation inverse-distance weighting algorithm laser tracing multi-station measurement coordinate measuring machine measurement

Author Community:

  • [ 1 ] [Chen Hongfang]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 2 ] [Zhang Shuang]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 3 ] [Liang Chaowei]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 4 ] [Tang Liang]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 5 ] [Shi Zhaoyao]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China

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Source :

CHINESE JOURNAL OF LASERS-ZHONGGUO JIGUANG

ISSN: 0258-7025

Year: 2020

Issue: 12

Volume: 47

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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