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Author:

Yan, An-Ru (Yan, An-Ru.) | Liu, Xue-Sheng (Liu, Xue-Sheng.) | Wang, Zhi-Yong (Wang, Zhi-Yong.) (Scholars:王智勇) | He, Ding-Yong (He, Ding-Yong.) (Scholars:贺定勇)

Indexed by:

EI Scopus PKU CSCD

Abstract:

To investigate the process and thermal physical performance of W-Ni-Cu manufactured using the Selective Laser Melting (SLM) technique, an experiment of four variables was conducted to study the influence of laser power, scanning speed, length of the scanning line, and overlap rate on the density. Scanning electron microscopy as well as a thermal analyzer, differential scanning calorimeter, and thermal-mechanical analyzer were used to study the microstructure, thermal conductivity, and thermal expansion. The results show that the density of W-Ni-Cu reaches 94.5% with the optimized process. The microstructure is a type of bridging connection, and agglomeration occurs between the W phases and CuNi phase that wraps around the W phase like a network. When the measuring direction is parallel to the processing direction, the thermal conductivity and thermal expansion coefficients are 120.314 0 W/m•K and 7.16×10-6/K, respectively. When the measuring direction is perpendicular to the processing direction, the thermal conductivity and thermal expansion coefficients are 99.257 2 W/m•K and 7.02×10-6/K, respectively. Test pieces form in different directions with different thermal conductivity and thermal expansion coefficients because of the distribution of W in CuNi and the existence of pores. The study shows that the W-Ni-Cu alloy parts exhibiting better performance can be manufactured directly using SLM. © 2019, Science Press. All right reserved.

Keyword:

Thermal expansion Scanning electron microscopy Thermal conductivity of solids Thermal conductivity Binary alloys Copper metallography Selective laser melting Melting Differential scanning calorimetry Nickel metallography Ternary alloys Copper alloys Microstructure Nickel alloys Thermoanalysis

Author Community:

  • [ 1 ] [Yan, An-Ru]Institute of Laser Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Liu, Xue-Sheng]Institute of Laser Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Wang, Zhi-Yong]Institute of Laser Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [He, Ding-Yong]Institute of Laser Engineering, Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address:

  • [yan, an-ru]institute of laser engineering, beijing university of technology, beijing; 100124, china

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Source :

Optics and Precision Engineering

ISSN: 1004-924X

Year: 2019

Issue: 5

Volume: 27

Page: 1024-1032

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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