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Author:

Jiang, Qian (Jiang, Qian.) | Meng, Junhua (Meng, Junhua.) | Shi, Yiming (Shi, Yiming.) | Yin, Zhigang (Yin, Zhigang.) | Chen, Jingren (Chen, Jingren.) | Zhang, Jing (Zhang, Jing.) | Wu, Jinliang (Wu, Jinliang.) | Zhang, Xingwang (Zhang, Xingwang.)

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EI Scopus

Abstract:

The behavior of H in β-Ga2O3 is of substantial interest because it is a common residual impurity that is present in β-Ga2O3, regardless of the synthesis methods. Herein, we report the influences of H-plasma exposure on the electric and optical properties of the heteroepitaxial β-Ga2O3 thin films grown on sapphire substrates by chemical vapor deposition. The results indicate that the H incorporation leads to a significantly increased electrical conductivity, a greatly reduced defect-related photoluminescence emission, and a slightly enhanced transmittance, while it has little effect on the crystalline quality of the β-Ga2O3 films. The significant changes in the electrical and optical properties of β-Ga2O3 may originate from the formation of shallow donor states and the passivation of the defects by the incorporated H. Temperature dependent electrical properties of the H-incorporated β-Ga2O3 films are also investigated, and the dominant scattering mechanisms at various temperatures are discussed. © 2021 Chinese Institute of Electronics.

Keyword:

Defects Optical properties Chemical vapor deposition Gallium compounds Plasma applications Hydrogen Sapphire Thin films

Author Community:

  • [ 1 ] [Jiang, Qian]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 2 ] [Jiang, Qian]School of Information Science and Technology, North China University of Technology, Beijing; 100144, China
  • [ 3 ] [Meng, Junhua]Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Shi, Yiming]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 5 ] [Shi, Yiming]Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Yin, Zhigang]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 7 ] [Yin, Zhigang]Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing; 100049, China
  • [ 8 ] [Chen, Jingren]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 9 ] [Chen, Jingren]Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing; 100049, China
  • [ 10 ] [Zhang, Jing]School of Information Science and Technology, North China University of Technology, Beijing; 100144, China
  • [ 11 ] [Wu, Jinliang]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 12 ] [Zhang, Xingwang]Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 13 ] [Zhang, Xingwang]Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing; 100049, China

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Source :

Journal of Semiconductors

ISSN: 1674-4926

Year: 2022

Issue: 9

Volume: 43

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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