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Author:

Zan, Tao (Zan, Tao.) | Liu, Zhihao (Liu, Zhihao.) | Wang, Hui (Wang, Hui.) | Wang, Min (Wang, Min.) (Scholars:王民) | Gao, Xiangsheng (Gao, Xiangsheng.)

Indexed by:

EI Scopus SCIE

Abstract:

Unnatural control chart patterns (CCPs) usually correspond to the specific factors in a manufacturing process, so the control charts have become important means of the statistical process control. Therefore, an accurate and automatic control chart pattern recognition (CCPR) is of great significance for manufacturing enterprises. In order to improve the CCPR accuracy, experts have designed various complex features, which undoubtedly increases the workload and difficulty of the quality control. To solve these problems, a CCPR method based on a one-dimensional convolutional neural network (1D-CNN) is proposed. The proposed method does not require to extract complex features manually; instead, it uses a 1D-CNN to obtain the optimal feature set from the raw data of the CCPs through the feature learning and completes the CCPR. The dataset for training and validation, containing six typical CCPs, is generated by the Monte-Carlo simulation. Then, the influence of the network structural parameters and activation functions on the recognition performance is analyzed and discussed, and some suggestions for parameter selection are given. Finally, the performance of the proposed method is compared with that of the traditional multi-layer perceptron method using the same dataset. The comparison results show that the proposed 1D-CNN method has obvious advantages in the CCPR tasks. Compared with the related literature, the features extracted by the 1D-CNN are of higher quality. Furthermore, the 1D-CNN trained with simulation dataset still perform well in recognizing the real dataset from the production environment.

Keyword:

Pattern recognition Control chart Deep learning Feature learning Convolutional neural network

Author Community:

  • [ 1 ] [Zan, Tao]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Liu, Zhihao]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Wang, Hui]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Wang, Min]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Gao, Xiangsheng]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Liu, Zhihao]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China

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Source :

JOURNAL OF INTELLIGENT MANUFACTURING

ISSN: 0956-5515

Year: 2020

Issue: 3

Volume: 31

Page: 703-716

8 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:115

Cited Count:

WoS CC Cited Count: 60

SCOPUS Cited Count: 74

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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