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Author:

Jiang, Guoqing (Jiang, Guoqing.) | Xu, Chen (Xu, Chen.) (Scholars:徐晨) | Xie, Yiyang (Xie, Yiyang.) | Xun, Meng (Xun, Meng.) | Cao, Yapeng (Cao, Yapeng.) | Chen, Hongda (Chen, Hongda.)

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EI Scopus PKU CSCD

Abstract:

By introducing the proton implantation(PI) process in the photonic crystal(PhC) vertical-cavity surface-emitting lasers (VCSEL) fabrication to confine the injection current in the devices can make the mesa process become pure plane technology. It reduced the fabrication difficult of the photonic crystal structure, simplified the fabrication processes, and improved the L-I-V characteristics uniformity of the devices. In the PI-PhC-VCSEL, the photonic crystal structure can control light beam and mode characteristics of the devices, when the current injection hole diameter is less than the center defect diameter of the photonic crystal. This effect in the PI-PhC-VCSEL can be used to optimize the threshold current and enhance the performance of the devices; it also can be used to realize high output power low threshold current single fundamental mode PI-PhC-VCSELs. A device with threshold current of 2.1 mA, output power larger than 1 mW, the divergence angle less than 7°was designed and produced. The device can operate with single fundamental mode with the injection current less than 12.5 mA and the effect of the photonic crystal in the PI-VCSEL has been demonstrated. © 2016, Editorial Board of Journal of Infrared and Laser Engineering. All right reserved.

Keyword:

Photonic crystals Photonic devices Fabrication Crystal structure Laser pulses Transceivers Surface emitting lasers

Author Community:

  • [ 1 ] [Jiang, Guoqing]Key Laboratory of Optoelectronics Technology, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Xu, Chen]Key Laboratory of Optoelectronics Technology, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Xie, Yiyang]Key Laboratory of Optoelectronics Technology, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Xie, Yiyang]Institute of Semiconductors, Chinese Academic of Sciences, Beijing; 100083, China
  • [ 5 ] [Xun, Meng]Key Laboratory of Optoelectronics Technology, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Cao, Yapeng]Institute of Semiconductors, Chinese Academic of Sciences, Beijing; 100083, China
  • [ 7 ] [Chen, Hongda]Institute of Semiconductors, Chinese Academic of Sciences, Beijing; 100083, China

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Source :

Infrared and Laser Engineering

ISSN: 1007-2276

Year: 2016

Issue: 12

Volume: 45

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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