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Author:

Yu, Naigong (Yu, Naigong.) (Scholars:于乃功) | Bai, Deguo (Bai, Deguo.)

Indexed by:

EI Scopus SCIE

Abstract:

The performance of facial expression recognition (FER) tends to deteriorate due to high intraclass variations and high interclass similarities. To address this problem, an expression recognition model based on a joint partial image and deep metric learning method (PI&DML) is proposed. First, we propose cropping the active units (AU) that are most closely related to the expression to generate a partial image for feature extraction, which is conducive to mitigating the negative impact of the abovementioned problems to some extent. Second, a novel expression metric loss function (EMLF) is suggested to enhance the intraclass similarities and interclass variations. Finally, superior performance is achieved by jointly optimizing the expression metric loss and classification loss. As demonstrated by the visualization results, the proposed EMLF is effective at increasing the distance between various expressions and reducing the distance between the same expressions. The evaluations on three public expression databases have demonstrated that our method is capable of achieving better results than the state-of-the-art methods.

Keyword:

jointly optimizing deep metric learning Facial expression recognition partial images metric loss function high interclass similarities high intraclass variations

Author Community:

  • [ 1 ] [Yu, Naigong]Beijing Univ Technol, Sch Artificial Intelligence & Automat, Dept Informat, Beijing 100124, Peoples R China
  • [ 2 ] [Yu, Naigong]Beijing Univ Technol, Beijing Key Lab Computat Intelligence & Intellige, Beijing 100124, Peoples R China
  • [ 3 ] [Yu, Naigong]Beijing Univ Technol, Digital Community Minist Educ Engn Res Ctr, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 于乃功

    [Yu, Naigong]Beijing Univ Technol, Sch Artificial Intelligence & Automat, Dept Informat, Beijing 100124, Peoples R China

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Source :

IEEE ACCESS

ISSN: 2169-3536

Year: 2020

Volume: 8

Page: 4700-4707

3 . 9 0 0

JCR@2022

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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