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Author:

Liang, Z. (Liang, Z..) | Yu, M. (Yu, M..) | Sun, Y. (Sun, Y..) | Dong, M. (Dong, M..)

Indexed by:

EI Scopus SCIE

Abstract:

Infrared and visible light fusion is a pivotal technique for image enhancement. Current methodologies, however, often overlook exposure errors during the fusion process, potentially compromising the quality of the outcomes. To tackle this challenge, we introduce a novel method titled “An Infrared and Visible Light Fusion Method for Enhanced Representation of Prominent Targets and Exposure Errors” (PEFusion). This approach incorporates a multi-scale exposure correction module to refine image quality in the presence of exposure discrepancies. Furthermore, we implement targeted enhancements during the fusion process. This method facilitates the creation of fused images that not only highlight prominent targets but also maintain high overall quality. Experimental results validate that PEFusion surpasses contemporary state-of-the-art methods in both quantitative and qualitative evaluations. The integration of exposure correction and target enhancement substantially enriches the texture and visual details of the merged images, rendering it exceptionally effective for sophisticated visual tasks. © 2024

Keyword:

Exposure Image enhancement Image Fusion

Author Community:

  • [ 1 ] [Liang Z.]Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science and Technology University, Beijing, 100016, China
  • [ 2 ] [Liang Z.]Guangzhou Nansha Intelligent Photonic Sensing Research Institute, Guangzhou, 511462, China
  • [ 3 ] [Yu M.]Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science and Technology University, Beijing, 100016, China
  • [ 4 ] [Yu M.]Guangzhou Nansha Intelligent Photonic Sensing Research Institute, Guangzhou, 511462, China
  • [ 5 ] [Sun Y.]Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science and Technology University, Beijing, 100016, China
  • [ 6 ] [Sun Y.]Guangzhou Nansha Intelligent Photonic Sensing Research Institute, Guangzhou, 511462, China
  • [ 7 ] [Sun Y.]Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing, 100124, China
  • [ 8 ] [Dong M.]Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science and Technology University, Beijing, 100016, China
  • [ 9 ] [Dong M.]Guangzhou Nansha Intelligent Photonic Sensing Research Institute, Guangzhou, 511462, China

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Source :

Infrared Physics and Technology

ISSN: 1350-4495

Year: 2024

Volume: 141

3 . 3 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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