Laser-induced　plasma　during　the　laser　lift-off　(LLO)　process　has　complex　dynamic　driving　evolution　behaviour,　presenting　a　challenge　in　achieving　non-destructive　mu　-LED　transfer.　This　study　systematically　explores　the　mechanism　of　homogeneous　mechanical　effect　by　confined　plasma　superfluid　reflection　for　lossless　mu　-LEDs　transfer.　The　stress　field　distribution　of　mu　-LEDs　subjected　to　the　transfer　process　is　simulated　from　the　transferred　mu　-LED　crack　morphology,　confirming　that　the　non-uniform　stress　concentration　points　caused　by　the　plasma　evolution　process　are　the　main　cause　of　mu　-LED　breakage.　The　confined　plasma　is　modelled　using　the　Fock-Plank　electron　density　theory　combined　with　the　electrostatic　sphere　shell　model　and　real-time　ICCD　imaging,　resulting　in　the　characteristic　law　of　the　plasma　in　a　confined　region　over　time.　The　results　show　that　the　plasma　expansion　velocity　and　the　geometry　of　the　interface　cavity　can　be　synchronously　adjusted　by　modulating　the　laser　irradiation　behaviour,　thus　realizing　its　critical　Mach　number　to　achieve　the　plasma　conversion　from　regular　reflection　to　Mach　reflection.　Based　on　modulating　of　superfluid　reflection　effect,　the　plasma　stress　field　is　effectively　homogenized,　inducing　a　damage-free　transfer　of　mu　-LEDs.　This　study　provides　a　novel　understanding　of　plasma　dynamics　in　the　picosecond　laser　transfer　process　and　lays　the　groundwork　for　achieving　high-quality,　non-destructive　mu　-LED　transfers.