• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Bai, Jie (Bai, Jie.) | An, Tong (An, Tong.) | Qin, Fei (Qin, Fei.) (Scholars:秦飞)

Indexed by:

EI Scopus

Abstract:

A 3D finite element model of board level BGA package was built and the Input-G method was used to analyze dynamic soldered joints stress in the package during drop/impact. Boundary condition, bolt effects of the test board and peeling stress mechanism were emphasized in current investigation. Dynamic responses of soldered joints in frequency domain and time domain were analyzed to find main mechanism of stress generation. The results show that bolt constraints have a significant influence on the dynamic stress in soldered joints. The bolt constraints must be treated as zero horizontal displacement in the area the bolt acted in the numerical model. The stress in the soldered joints reaches its peak at 0.4 ms and the maximum peeling stress is located at the most outer corner of the package. The peeling stress is dominated by the deflection of the PCB board. Due to effect of the 5th vibrating mode, the stress-time curve of the soldered joints is not smooth.

Keyword:

Electronic equipment Impact strength Soldered joints Boundary conditions Stress analysis Polychlorinated biphenyls Peeling Dynamic response Drops Finite element method Electronics packaging Magnetic domains Reliability

Author Community:

  • [ 1 ] [Bai, Jie]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [An, Tong]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Qin, Fei]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China

Reprint Author's Address:

Email:

Show more details

Related Keywords:

Related Article:

Source :

Journal of Shanghai Jiaotong University (Science)

ISSN: 1007-1172

Year: 2008

Issue: SUPPL.

Volume: 13

Page: 31-35

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

Online/Total:1700/10543940
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.