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Author:

Qin, Fei (Qin, Fei.) (Scholars:秦飞) | Jin, Ling (Jin, Ling.) | Wang, Yngve (Wang, Yngve.)

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EI Scopus PKU CSCD

Abstract:

4-point dynamic bending tests of board level electronics packages were carried out in order to investigate the reliability of solder joints. A high speed camera and the digital image correlation method were used to measure the deflection of the PCB board. A finite element model to simulate the test was built up and was validated by the test data. A parameter study was subsequently implemented. The results show that at certain value of PCB stiffness the peeling stress reaches its peak. The package installation angel has significant effect on the peeling stress of the solder joints.

Keyword:

Soldered joints High speed cameras Bending tests Electronics packaging Printed circuit boards Finite element method

Author Community:

  • [ 1 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Jin, Ling]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Wang, Yngve]Intel (China) Co. Ltd., Shanghai 200000, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2008

Issue: SUPPL.

Volume: 34

Page: 58-62

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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