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Author:

Ren, Zhi-Chao (Ren, Zhi-Chao.) | Lyu, Yan (Lyu, Yan.) | Gong, Yu (Gong, Yu.) | Song, Guo-Rong (Song, Guo-Rong.) | Chu, Kun (Chu, Kun.)

Indexed by:

EI

Abstract:

Sealed electronic equipment has been widely used in aerospace, defense electronics and other fields. Due to the limitation of production technology, it is easy to produce or retain surplus particles in the process of processing and manufacturing. Superfluous matter is one of the main factors affecting the reliability of sealed electronic equipment, and particle impact noise detection (PIND) is an effective method to detect the integrity and reliability of sealed electronic components. In this paper, a kind of high sensitivity PIND multi-channel sensor is developed for the detection of sealed electronic components, which is much higher than the signal-to-noise ratio of single channel sensor. Through multi-channel data fusion, the characteristic parameters sensitive to the signal characteristic information of the superfluous matter are extracted to realize the discrimination of whether there is more than 0.1mg of superfluous matter. The accuracy of the discrimination of whether there is more than 0.1mg of superfluous matter is 95%. © 2019 IEEE.

Keyword:

Electronic equipment Data fusion Acoustic noise Crystallography Network components Signal to noise ratio Piezoelectric devices Manufacture Piezoelectricity

Author Community:

  • [ 1 ] [Ren, Zhi-Chao]Beijing University of Technology, Institute of Nondestructive Testing and Evaluation, Beijing; 100124, China
  • [ 2 ] [Lyu, Yan]Beijing University of Technology, Institute of Nondestructive Testing and Evaluation, Beijing; 100124, China
  • [ 3 ] [Gong, Yu]Beijing University of Technology, Institute of Nondestructive Testing and Evaluation, Beijing; 100124, China
  • [ 4 ] [Song, Guo-Rong]Beijing University of Technology, Institute of Nondestructive Testing and Evaluation, Beijing; 100124, China
  • [ 5 ] [Chu, Kun]Beijing University of Technology, Institute of Nondestructive Testing and Evaluation, Beijing; 100124, China

Reprint Author's Address:

  • [lyu, yan]beijing university of technology, institute of nondestructive testing and evaluation, beijing; 100124, china

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Year: 2019

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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