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SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES
ISSN: 2051-672X
Year: 2019
Issue: 2
Volume: 7
2 . 7 0 0
JCR@2022
ESI Discipline: PHYSICS;
ESI HC Threshold:123
JCR Journal Grade:3
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 9
Affiliated Colleges: