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Author:

Qin, Fei (Qin, Fei.) (Scholars:秦飞) | Wang, Xiaoliang (Wang, Xiaoliang.) | An, Tong (An, Tong.)

Indexed by:

EI Scopus

Abstract:

The effects of the intermetallic compound (IMC) microstructure on the tensile strength and the fracture behavior of Sn3.5Ag0.5Cu/Cu solder joints are investigated. The soldered samples are isothermally aged at 150 °C for 0, 72, 288, 500 hours, respectively, and then are tested at the strain rate of 2×10-4 s-1 at room temperature in air. The experimental results show that with the increase of the isothermal aging time, the IMC layer thickness increases, and the roughness of the solder/IMC interface decreases. The tensile strength of the solder joint decreases with either increasing IMC thickness or increasing solder/IMC interfacial roughness, and the fracture mode migrates from ductile fracture in bulk solder to brittle fracture in the IMC layer with increasing aging time. © 2013 IEEE.

Keyword:

Strain rate Ductile fracture Electronics packaging Intermetallics Fracture mechanics Isotherms Tensile strength

Author Community:

  • [ 1 ] [Qin, Fei]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 2 ] [Wang, Xiaoliang]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China
  • [ 3 ] [An, Tong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China

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Year: 2013

Page: 857-860

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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