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Author:

Zhang, Zhi-Qing (Zhang, Zhi-Qing.) (Scholars:张志清) | Zhou, Yu-Liang (Zhou, Yu-Liang.) | Zhang, Yong (Zhang, Yong.) (Scholars:张勇) | Jia, Yan (Jia, Yan.) | Chen, Rui (Chen, Rui.) | Ren, Hui (Ren, Hui.)

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EI Scopus

Abstract:

In order to analyze the early destruction of asphalt pavement theoretically, it takes the inter-connection conditions of a first-class highway asphalt pavement structure as the research object. Using a piece of pavement structural analysis software based on the theory of elastic multi-layered systems. From the numerical analysis of stress changes in the asphalt pavement structure layers, it considers that the inter-connection conditions between layers will change the stress status on size and position, the worse connections the inter-layers are, the larger the generated stress becomes. Therefore the position of the stress is more unfavorable. In the end, the deflection will become larger, and it will affect the service life of asphalt pavement structure. So, inter-connection conditions between layers are the major factor in early destruction of asphalt pavement structure. © 2010 ASCE.

Keyword:

Asphalt pavements Asphalt Waveguide couplers

Author Community:

  • [ 1 ] [Zhang, Zhi-Qing]Transportation Research Center, Beijing University of Technology, P.O.Box 100024, Beijing, China
  • [ 2 ] [Zhou, Yu-Liang]Transportation Research Center, Beijing University of Technology, P.O.Box 100024, Beijing, China
  • [ 3 ] [Zhang, Yong]Transportation Research Center, Beijing University of Technology, P.O.Box 100024, Beijing, China
  • [ 4 ] [Jia, Yan]Transportation Research Center, Beijing University of Technology, P.O.Box 100024, Beijing, China
  • [ 5 ] [Chen, Rui]Transportation Research Center, Beijing University of Technology, P.O.Box 100024, Beijing, China
  • [ 6 ] [Ren, Hui]Transportation Research Center, Beijing University of Technology, P.O.Box 100024, Beijing, China

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Source :

Year: 2010

Volume: 382

Page: 3716-3724

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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