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Author:

Jie, Bai (Jie, Bai.) | Fei, Qin (Fei, Qin.) (Scholars:秦飞) | Tong, An (Tong, An.)

Indexed by:

EI Scopus

Abstract:

A 3-D finite element model of board level BGA package was built and the Input-G method was used to analyze dynamic solder joint stress in the package during drop/impact. Boundary condition, bolt effects of the test board and peeling stress mechanism were emphasized in current investigation. Dynamic responses of solder joint in frequency domain and time domain were analyzed to find main mechanism of stress generation. The results show that bolt constraints have a significant influence on the dynamic stress in solder joints. The bolt constraints must be treated as zero horizontal displacement in the area the bolt acted in the numerical model. The stress in the solder joint reaches its peak at 0.4ms and the maximum peeling stress is located at the most outer corner of the package. The peeling stress is dominated by the deflection of the PCB board. Due to effect of the 5th vibrating mode, the stress-time curve of the solder joints is not smooth. ©2007 IEEE.

Keyword:

Bolts Printed circuit boards Dynamics Electronics packaging Frequency domain analysis Drops Packaging

Author Community:

  • [ 1 ] [Jie, Bai]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Fei, Qin]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Tong, An]School of Mechanical Engineering and Applied Electronic Technology, Beijing University of Technology, Beijing 100022, China

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Year: 2007

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 6

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