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Author:

Song, G.Q. (Song, G.Q..) | Shi, X.Q. (Shi, X.Q..) | Qin, F. (Qin, F..) (Scholars:秦飞) | He, C.F. (He, C.F..) (Scholars:何存富)

Indexed by:

EI Scopus

Abstract:

In this study, fracture tests of chip/underfill/chip sandwiched system were carried out, with non-contact and non-destructive digital image correlation (DIC) technique, under various loading angles from 20° to 90° for different temperature levels of 25, 75 and 125°C or after moisture ageing at 85°C/85%RH, to study the effects of loading angle, temperature and moisture on the interface fracture toughness. With the results, the mode I and mode II critical fracture toughness based failure assessment diagrams (FADs) were established for reliability design and failure assessment of underfill/chip interface at different thermal cycling loading and moisture conditions. © 2006 IEEE.

Keyword:

Interfaces (materials) Moisture Thermal effects Microprocessor chips Fracture toughness Image processing Loads (forces) Correlation methods Failure (mechanical)

Author Community:

  • [ 1 ] [Song, G.Q.]School of Civil Engineering, Nanchang University, 339 East Beijing Rd., Nanchang, Jiangxi 330029, China
  • [ 2 ] [Shi, X.Q.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, No. 100, Pingleyuan, Chaoyang, Beijing 100022, China
  • [ 3 ] [Qin, F.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, No. 100, Pingleyuan, Chaoyang, Beijing 100022, China
  • [ 4 ] [He, C.F.]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, No. 100, Pingleyuan, Chaoyang, Beijing 100022, China

Reprint Author's Address:

  • [song, g.q.]school of civil engineering, nanchang university, 339 east beijing rd., nanchang, jiangxi 330029, china

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Source :

Year: 2006

Volume: 2006

Page: 1147-1152

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 20

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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