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Author:

Hassan, Ali (Hassan, Ali.) | Irfan, Muhammad (Irfan, Muhammad.) | Jiang, Yijian (Jiang, Yijian.) (Scholars:蒋毅坚)

Indexed by:

EI Scopus SCIE

Abstract:

The structural, morphological, and optical characteristics of GZO ultra-thin films were investigated using XRD (X-ray diffraction), FE-SEM (field emission electron microscopy), in situ EDS (Energy Dispersive X-ray) spectroscopy, UV-VIS-IR spectroscopy and photoluminescence spectroscopy (PL) respectively. Morphological analysis reveals the noodle, seed and particle like structure of GZO for GaN, sapphire and Si substrates respectively with average grain size ranging from 5 to 20 nm. An effective mass model (EM-Model) for particle in a cylindrical wave function of e-h pair was correlated with experimental results. The reduction in FWHM value (from 31 nm to 13 nm) of NBE (near-band-edge) emission peak and enhanced NBE intensity have been achieved with small grain size. Blue shift in optical band gap is explained in term of grain radius by EM-model. Improved optical and structural properties were found in relation with quantum confinement effect. The current study states that grain size plays vital role in order to tailor optical properties of GZO thin films. (C) 2017 Elsevier B.V. All rights reserved.

Keyword:

Semiconductor Epitaxial growth Laser Processing Thin films Luminescence

Author Community:

  • [ 1 ] [Hassan, Ali]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Jiang, Yijian]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Irfan, Muhammad]Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Inst Phys, Beijing 100190, Peoples R China

Reprint Author's Address:

  • [Hassan, Ali]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China

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Source :

MATERIALS LETTERS

ISSN: 0167-577X

Year: 2018

Volume: 210

Page: 358-362

3 . 0 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:260

Cited Count:

WoS CC Cited Count: 11

SCOPUS Cited Count: 11

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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