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Author:

Xu, Liping (Xu, Liping.) | Li, Xin (Li, Xin.) | Zhan, Zhaoyao (Zhan, Zhaoyao.) | Wang, Lian (Wang, Lian.) | Feng, Shuanglong (Feng, Shuanglong.) | Chai, Xiangyu (Chai, Xiangyu.) | Lu, Wenqiang (Lu, Wenqiang.) | Shen, Jun (Shen, Jun.) | Weng, Zhankun (Weng, Zhankun.) | Sun, Jie (Sun, Jie.)

Indexed by:

EI Scopus SCIE PubMed

Abstract:

Catalyst-free, selective growth of ZnO nanowires directly on the commonly used dielectric SiO2 layer is of both scientific significance and application importance, yet it is still a challenge. Here, we report a facile method to grow single-crystal ZnO nanowires on a large scale directly on SiO2/Si substrate through vapor solid mechanism without using any predeposited metal catalyst or seed layer. We found that a rough SiO2/Si substrate surface created by the reactive ion etching is critical for ZnO growth without using catalyst. ZnO nanowire array exclusively grows in area etched by the reactive ion etching method. The advantages of this method include facile and safe roughness-assisted catalyst-free growth of ZnO nanowires on SiO2/Si substrate and the subsequent transfer-free fabrication of electronic or optoelectronic devices. The ZnO nanowire UV photodetector fabricated by a transfer-free process presented high performance in responsivity, quantum efficiency and response speed, even without any post-treatments. The strategy shown here would greatly reduce the complexity in nanodevice fabrication and give an impetus to the application of ZnO nanowires in nanoelectronics and optoelectronics.

Keyword:

UV photodetector catalyst-free transfer-free ZnO nanowires

Author Community:

  • [ 1 ] [Xu, Liping]Changchun Univ Sci & Technol, Sch Elect & Informat Engn, Changchun 130022, Jilin, Peoples R China
  • [ 2 ] [Chai, Xiangyu]Changchun Univ Sci & Technol, Sch Elect & Informat Engn, Changchun 130022, Jilin, Peoples R China
  • [ 3 ] [Weng, Zhankun]Changchun Univ Sci & Technol, Sch Elect & Informat Engn, Changchun 130022, Jilin, Peoples R China
  • [ 4 ] [Xu, Liping]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing 400714, Peoples R China
  • [ 5 ] [Li, Xin]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing 400714, Peoples R China
  • [ 6 ] [Zhan, Zhaoyao]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing 400714, Peoples R China
  • [ 7 ] [Wang, Lian]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing 400714, Peoples R China
  • [ 8 ] [Feng, Shuanglong]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing 400714, Peoples R China
  • [ 9 ] [Lu, Wenqiang]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing 400714, Peoples R China
  • [ 10 ] [Shen, Jun]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing 400714, Peoples R China
  • [ 11 ] [Xu, Liping]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China
  • [ 12 ] [Li, Xin]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China
  • [ 13 ] [Zhan, Zhaoyao]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China
  • [ 14 ] [Wang, Lian]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China
  • [ 15 ] [Feng, Shuanglong]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China
  • [ 16 ] [Lu, Wenqiang]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China
  • [ 17 ] [Shen, Jun]Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China
  • [ 18 ] [Sun, Jie]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Weng, Zhankun]Changchun Univ Sci & Technol, Sch Elect & Informat Engn, Changchun 130022, Jilin, Peoples R China

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Source :

ACS APPLIED MATERIALS & INTERFACES

ISSN: 1944-8244

Year: 2015

Issue: 36

Volume: 7

Page: 20264-20271

9 . 5 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:319

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 65

SCOPUS Cited Count: 72

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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