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Author:

Lei, Jun (Lei, Jun.) (Scholars:雷钧) | Zhang, Chuanzeng (Zhang, Chuanzeng.) | Garcia-Sanchez, Felipe (Garcia-Sanchez, Felipe.)

Indexed by:

EI Scopus SCIE

Abstract:

In this paper, the electrically limited permeable piezoelectric cracks considering the induced Coulomb tractions on the crack faces are studied with respect to the dielectric constant of the crack medium by BEM. As limiting cases, the permeable and impermeable electric crack-face boundary conditions are also considered. Based on the dual boundary integral equations, the crack-tip field intensity factors and the energy release rate are evaluated by the displacement extrapolation method and the J-integral method, respectively. The crack-face part of the contour integral is then handled by two approaches, namely numerical quadrature and approximate formula. The analytical solutions for a Griffith crack are also presented for verification purpose. Three examples are presented to check the efficiency and the accuracy of these approaches. The effects of the dielectric constant of the crack medium and the induced Coulomb tractions on the crack-tip field intensity factors and the energy release rate are also discussed. (C) 2015 Elsevier Ltd. All rights reserved.

Keyword:

Coulomb traction Electrically limited permeable BEM Energy release rate J-integral Piezoelectric materials

Author Community:

  • [ 1 ] [Lei, Jun]Beijing Univ Technol, Dept Engn Mech, Beijing 100124, Peoples R China
  • [ 2 ] [Zhang, Chuanzeng]Univ Siegen, Dept Civil Engn, D-57068 Siegen, Germany
  • [ 3 ] [Garcia-Sanchez, Felipe]Univ Malaga, ETS Ingn Ind, Dept Ingn Civil Mat & Fabricac, Malaga 29013, Spain

Reprint Author's Address:

  • 雷钧

    [Lei, Jun]Beijing Univ Technol, Dept Engn Mech, Beijing 100124, Peoples R China

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Source :

ENGINEERING ANALYSIS WITH BOUNDARY ELEMENTS

ISSN: 0955-7997

Year: 2015

Volume: 54

Page: 28-38

3 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:174

JCR Journal Grade:1

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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