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Author:

Lei, Jun (Lei, Jun.) (Scholars:雷钧) | Wang, Hongyan (Wang, Hongyan.) | Zhang, Chuanzeng (Zhang, Chuanzeng.) | Tinh Quoc Bui (Tinh Quoc Bui.) | Garcia-Sanchez, Felipe (Garcia-Sanchez, Felipe.)

Indexed by:

EI Scopus SCIE

Abstract:

From the viewpoint of fracture mechanics, of importance is the near-tip field which can be characterized as field intensity factors. In this paper, the crack-tip field intensity factors of the stress and electric displacement in two dimensional piezoelectric solids are evaluated by using four approaches including the displacement extrapolation, the stress method, the J-integral and the modified crack closure integral method (MCCI) based on a boundary element method (BEM). The strongly singular displacement boundary integral equations (BIEs) are applied on the external boundary of the cracked solid, while the hypersingular traction BIEs are used on the crack faces. Three numerical examples are presented to show the path independence and the high accuracy of the J-integral in piezoelectric materials and to analyze the pros and cons of these approaches in evaluating the field intensity factors.

Keyword:

BEM MCCI J-integral Piezoelectric Displacement extrapolation

Author Community:

  • [ 1 ] [Lei, Jun]Beijing Univ Technol, Dept Engn Mech, Beijing 100124, Peoples R China
  • [ 2 ] [Wang, Hongyan]Beijing Univ Technol, Dept Engn Mech, Beijing 100124, Peoples R China
  • [ 3 ] [Zhang, Chuanzeng]Univ Siegen, Dept Civil Engn, D-57068 Siegen, Germany
  • [ 4 ] [Tinh Quoc Bui]Univ Siegen, Dept Civil Engn, D-57068 Siegen, Germany
  • [ 5 ] [Garcia-Sanchez, Felipe]Univ Malaga, Dept Ingn Civil Mat & Fabricac, ETS Ingenieros Ind, Malaga 29013, Spain

Reprint Author's Address:

  • 雷钧

    [Lei, Jun]Beijing Univ Technol, Dept Engn Mech, Beijing 100124, Peoples R China

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Source :

INTERNATIONAL JOURNAL OF FRACTURE

ISSN: 0376-9429

Year: 2014

Issue: 1

Volume: 189

Page: 111-120

2 . 5 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:176

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 25

SCOPUS Cited Count: 28

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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