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Author:

Yue, Yonghai (Yue, Yonghai.) | Chen, Nianke (Chen, Nianke.) | Li, Xianbin (Li, Xianbin.) | Zhang, Shengbai (Zhang, Shengbai.) | Zhang, Ze (Zhang, Ze.) | Chen, Mingwei (Chen, Mingwei.) | Han, Xiaodong (Han, Xiaodong.) (Scholars:韩晓东)

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EI Scopus SCIE PubMed

Abstract:

Via in situ TEM tensile tests on single crystalline copper nanowires with an advanced tensile device, we report here a crystalline-liquid-rubber-like (CRYS-LIQUE-R) behavior in fracturing crystalline metallic nanowires. A retractable strain of the fractured crystalline Cu nanowires can approach over 35%. This astonishing CRYS-LIQUE-R behavior of the fracturing highly strained single crystalline Cu nanowires originates from an instant release of the stored ultralarge elastic energy in the crystalline nanowires. The release of the ultralarge elastic energy was estimated to generate a huge reverse stress as high as similar to 10 GPa. The effective diffusion coefficient (D-eff) increased sharply due to the consequent pressure gradient. In addition, due to the release of ultrahigh elastic energy, the estimated concomitant temperature increase was estimated as high as 0.6 Tm (Tm is the melting point of nanocrystalline Cu) on the fractured tip of the nanowires. These factors greatly enhanced the atomic diffusion process. Molecular dynamic simulations revealed that the very high reverse stress triggered dislocation nucleation and exhaustion.

Keyword:

Crystalline-liquid-rubber (CRYS-LIQUE-R) large retractable strain in situ TEM single crystalline Cu pressure gradient effective diffusion nanowires

Author Community:

  • [ 1 ] [Yue, Yonghai]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing 100124, Peoples R China
  • [ 2 ] [Zhang, Ze]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing 100124, Peoples R China
  • [ 3 ] [Han, Xiaodong]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing 100124, Peoples R China
  • [ 4 ] [Li, Xianbin]Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130012, Peoples R China
  • [ 5 ] [Zhang, Shengbai]Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130012, Peoples R China
  • [ 6 ] [Zhang, Shengbai]Rensselaer Polytech Inst, Dept Phys Appl Phys & Astron, Troy, NY 12180 USA
  • [ 7 ] [Zhang, Ze]ZheJiang Univ, Dept Mat Sci, State Key Lab Si Mat, Hangzhou 310058, Zhejiang, Peoples R China
  • [ 8 ] [Chen, Mingwei]Tohoku Univ, WPI Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan
  • [ 9 ] [Yue, Yonghai]Beihang Univ, Sch Chem & Environm, Beijing 100191, Peoples R China

Reprint Author's Address:

  • [Zhang, Shengbai]Jilin Univ, Coll Elect Sci & Engn, State Key Lab Integrated Optoelect, Changchun 130012, Peoples R China

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Source :

NANO LETTERS

ISSN: 1530-6984

Year: 2013

Issue: 8

Volume: 13

Page: 3812-3816

1 0 . 8 0 0

JCR@2022

ESI Discipline: PHYSICS;

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 45

SCOPUS Cited Count: 46

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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