• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Wang, Jinhui (Wang, Jinhui.) | Gong, Na (Gong, Na.) | Hou, Ligang (Hou, Ligang.) | Peng, Xiaohong (Peng, Xiaohong.) | Geng, Shuqin (Geng, Shuqin.) | Wu, Wuchen (Wu, Wuchen.) (Scholars:吴武臣)

Indexed by:

EI Scopus SCIE

Abstract:

A hybrid network technique is proposed in dynamic CMOS XOR/XNOR gate to reduce the power consumption, save the layout area and avoid signal skew. Compared to the standard N type dynamic gate with similar delay time, the leakage power, dynamic power and layout area of the novel XOR/XNOR gate are reduced by up to 51%, 13% and 24%, respectively. Also, the inputs and clock signals combination static state dependent leakage characteristics of three dynamic CMOS XOR/XNOR gates are analyzed thoroughly. Finally, their robustness to noise, process and temperature variations are discussed. (C) 2011 Elsevier B.V. All rights reserved.

Keyword:

Variation Leakage Dynamic XOR/XNOR Gate Power

Author Community:

  • [ 1 ] [Wang, Jinhui]Beijing Univ Technol, VLSI, Beijing, Peoples R China
  • [ 2 ] [Hou, Ligang]Beijing Univ Technol, VLSI, Beijing, Peoples R China
  • [ 3 ] [Peng, Xiaohong]Beijing Univ Technol, VLSI, Beijing, Peoples R China
  • [ 4 ] [Geng, Shuqin]Beijing Univ Technol, VLSI, Beijing, Peoples R China
  • [ 5 ] [Wu, Wuchen]Beijing Univ Technol, VLSI, Beijing, Peoples R China
  • [ 6 ] [Wang, Jinhui]Beijing Univ Technol, Syst Lab, Beijing, Peoples R China
  • [ 7 ] [Hou, Ligang]Beijing Univ Technol, Syst Lab, Beijing, Peoples R China
  • [ 8 ] [Peng, Xiaohong]Beijing Univ Technol, Syst Lab, Beijing, Peoples R China
  • [ 9 ] [Geng, Shuqin]Beijing Univ Technol, Syst Lab, Beijing, Peoples R China
  • [ 10 ] [Wu, Wuchen]Beijing Univ Technol, Syst Lab, Beijing, Peoples R China
  • [ 11 ] [Gong, Na]SUNY Buffalo, Dept Comp Sci & Engn, Buffalo, NY 14260 USA

Reprint Author's Address:

  • [Wang, Jinhui]Beijing Univ Technol, VLSI, Beijing, Peoples R China

Show more details

Related Keywords:

Source :

MICROELECTRONIC ENGINEERING

ISSN: 0167-9317

Year: 2011

Issue: 8

Volume: 88

Page: 2781-2784

2 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 16

SCOPUS Cited Count: 22

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

Online/Total:1293/10605526
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.