The　charge　contrast　images　(CCI)　on　insulating　or　poorly　conducting　samples　were　observed　under　steady-state　charging　conditions　with　a　thermal　field　emission　scanning　electron　microscope　under　high　vacuum　by　using,　an　Everhart-Thornley　detector.　The　charge　contrast　on　plumbous　titanate-nickel　composite　particles　and　patterned　sapphires　could　be　the　indicators　of　near-surface　features,　compositional　variations　and　conductivity　distributions.　Optimum　imaging　conditions　for　observing　the　CCI　include　the　electron　energy,　the　electron　flux　density　and　the　electron　dose.　Contrast　characteristics　associated　with　surface　and　near-surface　secondary　electron　emission　yield　enhanced　above　the　trapped　charge-up　regions,　as　charge　trapping　selectively　enhanced　the　poorly　conductive　phase　and　lattice　distorted　area.