Indexed by:
Abstract:
采用Rietveld分析法研究Li1+xCoO2正极活性材料的微结构信息.结果表明,合成过程中,Li/Co比对钴酸锂正极材料的C轴取向生长有重要影响,C轴的取向度可解释(006)衍射强度的规律变化.通过调整原子坐标位置参数和占有率,可解释(003)和(104)谱线强度的异常变化.
Keyword:
Reprint Author's Address:
Email:
Source :
有色金属
ISSN: 1001-0211
Year: 2003
Issue: 3
Volume: 55
Page: 13-15
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: 1
Chinese Cited Count:
30 Days PV: 4
Affiliated Colleges: