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Author:

Shu, XW (Shu, XW.) | Xu, C (Xu, C.) (Scholars:徐晨) | Tian, ZX (Tian, ZX.) | Shen, GD (Shen, GD.)

Indexed by:

EI Scopus SCIE

Abstract:

The paper reports for the first time a simple, economical and available way for passivating air cleaved facets of high power semiconductor lasers with Al-contained active region using a electron-beam evaporated ZnSe thin layer, which was demonstrated to be an effective way for improving the reliability of high power lasers. (C) 2005 Elsevier Ltd. All rights reserved.

Keyword:

electron-beam evaporation reliability facet passivation

Author Community:

  • [ 1 ] Beijing Univ Technol, Beijing Optoelect Technol Lab, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Shu, XW]Beijing Univ Technol, Beijing Optoelect Technol Lab, Sch Elect Informat & Control Engn, Beijing 100022, Peoples R China

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Source :

SOLID-STATE ELECTRONICS

ISSN: 0038-1101

Year: 2005

Issue: 12

Volume: 49

Page: 2016-2017

1 . 7 0 0

JCR@2022

ESI Discipline: PHYSICS;

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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