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Author:

Tai, F (Tai, F.) | Guo, F (Guo, F.) (Scholars:郭福) | Xia, ZD (Xia, ZD.) | Lei, YP (Lei, YP.) (Scholars:雷永平) | Yan, YF (Yan, YF.) | Liu, JP (Liu, JP.) (Scholars:刘加平) | Shi, YW (Shi, YW.)

Indexed by:

EI Scopus SCIE

Abstract:

In this research, nanosized Ag reinforcement particles were incorporated by mechanical means into a promising lead-free solder, Sn-0.7Cu, in an effort to improve the comprehensive property of the Sn-0.7Cu solder. Wettability, mechanical performance, and creep-rupture life tests were conducted to study the difference between Sn-0.7Cu solder and its composite solder with different Ag reinforcement volume fractions. Experimental results indicated that the composite solders and their joints showed better wettability and mechanical properties, as well as longer creep-rupture lives, than Sn-0.7Cu solder. The composite solder with 1vol.%Ag reinforcement addition exhibited the best comprehensive property as compared to the composite solders with other reinforcement volume fractions. Systematic creep-rupture life tests were conducted on the 1vol.%Ag-reinforced Sn-0.7Cu-based composite solder joints. Significant enhancement of the creep-rupture lives were found in the composite solder joints under different stress and temperature combinations as compared to the Sn-0.7Cu solder joint. Ductile rupture surfaces were exhibited in most of the broken solder joints.

Keyword:

composite solder microstructure creep-rupture life lead-free solder nanosized solderability

Author Community:

  • [ 1 ] Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ PRC, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Tai, F]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ PRC, Beijing 100022, Peoples R China

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Source :

JOURNAL OF ELECTRONIC MATERIALS

ISSN: 0361-5235

Year: 2005

Issue: 11

Volume: 34

Page: 1357-1362

2 . 1 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 54

SCOPUS Cited Count: 64

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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