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Author:

Shi, YW (Shi, YW.) | Chen, D (Chen, D.) | Lei, YP (Lei, YP.) (Scholars:雷永平) | Li, XY (Li, XY.)

Indexed by:

EI Scopus SCIE

Abstract:

In the present work the evolution of grain structure in the weld HAZ (heat affected zone) under welding thermal cycle was simulated. Especially the grain growth in the HAZ of a SS400 ultra fine grain steel was investigated. An integrated 3-D Monte Carlo (MC) simulation system for grain growth of the weld HAZ was developed based on Microsoft Windows. The results indicate that MC simulation is an effective way to investigate the grain growth in weld HAZ. The method not only simulates the non-isothermal dynamics process of the grain growth in the weld HAZ, but also visualizes the austenite grains realistically. Moreover, the thermal pinning effect can be easily included in the simulation process. The grain sizes of the CGHAZ (coarse grain heat affected zone) obtained from MC simulation are basically in agreement with the experimental measurement of the real welded joints under different heat input. Furthermore, the simulation indicates that the grain growth degree is higher for the SS400 ultra fine grain steel compared to conventional steel. With the increase in the heat input, the grain growth of the CGHAZ rapidly increases. Because the activation energy of the grain growth is lower for the SS400 ultra fine grain steel, austenite grains can grow at a relatively lower temperature, hence the range of the CGHAZ becomes wider. (C) 2004 Elsevier B.V. All rights reserved.

Keyword:

ultra fine grain steel grain growth Monte Carlo simulation weld HAZ

Author Community:

  • [ 1 ] Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Shi, YW]Beijing Univ Technol, Sch Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100022, Peoples R China

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Source :

COMPUTATIONAL MATERIALS SCIENCE

ISSN: 0927-0256

Year: 2004

Issue: 3-4

Volume: 31

Page: 379-388

3 . 3 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 32

SCOPUS Cited Count: 40

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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