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Author:

郭伟玲 (郭伟玲.) | 李志国 (李志国.)

Indexed by:

CQVIP PKU

Keyword:

金属化 半导体器件 欧姆接触 可靠性

Author Community:

  • [ 1 ] [郭伟玲]北京工业大学电子工程系可靠性物理实验室
  • [ 2 ] [李志国]北京工业大学电子工程系可靠性物理实验室

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Source :

微电子学

ISSN: 1004-3365

Year: 1996

Page: 235-239

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: -1

Chinese Cited Count:

30 Days PV: 6

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