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Author:

Ma Weidong (Ma Weidong.) | Guo Min (Guo Min.) | Meng Xielei (Meng Xielei.) | Lv Changzhi (Lv Changzhi.) | Xie Xuesong (Xie Xuesong.) | Zhang Xiaoling (Zhang Xiaoling.) | Liying (Liying.)

Indexed by:

CPCI-S

Abstract:

With the development of manufacturing technology and process level, the reliability of DC/DC converter becomes higher and higher, which is a big challenge to the reliability evaluation of DC/DC converter. In this paper, to solve the problem, DC/DC converter is studied by the test of constant electrical stress and temperature ramp stress method (CETRM). With CETRM, time and cost of the test are efficiently reduced. Ten DC/DC converters are tested using CETRM. Failure sensitive parameter, activation energy, failure temperature, failure rate, lifetime and failure rate are acquired, which testifies the application and efficiency of CETRM for DC/DC converter proposed in this paper.

Keyword:

DC/DC converter constant electrical stress and temperature ramp stress method (CETRM) reliability lifetime

Author Community:

  • [ 1 ] [Ma Weidong]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China
  • [ 2 ] [Guo Min]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China
  • [ 3 ] [Meng Xielei]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China
  • [ 4 ] [Lv Changzhi]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China
  • [ 5 ] [Xie Xuesong]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China
  • [ 6 ] [Zhang Xiaoling]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China
  • [ 7 ] [Liying]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China

Reprint Author's Address:

  • [Ma Weidong]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China

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Source :

2011 INTERNATIONAL CONFERENCE ON ELECTRONICS, COMMUNICATIONS AND CONTROL (ICECC)

Year: 2011

Page: 1056-1059

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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