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Author:

Xiao, Yixin (Xiao, Yixin.) | Zhang, Xin (Zhang, Xin.) | Li, Rongrong (Li, Rongrong.) | Liu, Hongliang (Liu, Hongliang.) | Hu, Yanlin (Hu, Yanlin.) | Zhang, Jiuxing (Zhang, Jiuxing.)

Indexed by:

EI Scopus SCIE

Abstract:

Large-size and high-quality single-crystal GdB(6)conductive ceramics (length greater than 35 mm and diameter greater than 6 mm) were prepared by optical zone melting, and the single-crystal quality was characterized by single-crystal diffraction, Laue photo, crystal plane rocking curve, and single-crystal fracture scan. Electrochemical corrosion equipment of single-crystal GdB(6)conductive ceramic tips was newly designed, which greatly reduced the preparation time of tips from more than 10 h to 2.75 h. The field electron emission current density of the single-crystal GdB(6)conductive ceramic tip (r approximate to 500 nm) prepared by the device under applied voltage (2550 V) is 2.24 x 10(4)A/cm(2). This paper also theoretically calculates the electronic structure and electron work function of single-crystal GdB(6)under a strong electric field (0.1 V/angstrom). The trapping ability of the B-octahedron in the single crystal GdB(6)conductive ceramics against the free electrons of Gd is greatly weakened under a strong electric field (0.1 V/angstrom), and the free electrons also have a certain enrichment phenomenon on the surface of GdB6. The surface barrier of single-crystal GdB(6)conductive ceramic will be shortened and narrowed sharply due to the strong electric field (0.1 V/angstrom), which causes the work function of (100) crystal plane of single-crystal GdB(6)to decrease sharply (0.38 eV). This causes the free electrons in Gd to have greater energy at the time of emission, and it is easier to get rid of the trap of surface barriers, which is conducive to field electron emission.

Keyword:

field electron emission single-crystal GdB(6)tip Optical zone melting first principle

Author Community:

  • [ 1 ] [Xiao, Yixin]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 2 ] [Zhang, Xin]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 3 ] [Li, Rongrong]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 4 ] [Liu, Hongliang]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 5 ] [Zhang, Jiuxing]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China
  • [ 6 ] [Zhang, Jiuxing]Hefei Univ Technol, Sch Mat Sci & Engn, Hefei 230009, Peoples R China
  • [ 7 ] [Hu, Yanlin]Beijing Inst Control Engn, Beijing 100080, Peoples R China

Reprint Author's Address:

  • [Zhang, Xin]Beijing Univ Technol, Coll Mat Sci & Engn, Key Lab Adv Funct Mat, Minist Educ, Beijing 100124, Peoples R China

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Source :

JOURNAL OF ELECTRONIC MATERIALS

ISSN: 0361-5235

Year: 2020

Issue: 9

Volume: 49

Page: 5622-5630

2 . 1 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:169

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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