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Abstract:
用解析的方法模拟了T=300K和77K时,fT和fmax与集电极电流密度Jc的关系,在大电流下考虑了异质结势垒效应的影响。模拟结果和用数值方法以及实验所得到的结果一致。同时,还建立了与之相应的Si/SiGeeb异质结和SiGe/Sibc异质结电容模型。
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固体电子学研究与进展
Year: 1998
Issue: 03
Page: 291-301
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 10
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