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Author:

Gao, Dongwen (Gao, Dongwen.) | Wang, Li (Wang, Li.) | Su, Xueqiong (Su, Xueqiong.) | Wang, Jin (Wang, Jin.) | Chen, Ruixiang (Chen, Ruixiang.)

Indexed by:

EI Scopus SCIE

Abstract:

In this paper, the method of thin film preparation is pulsed laser deposition (PLD). ZnS:Co thin film was grown on sapphire and glass substrates at different temperatures (pressures) by PLD, and we studied a series of optical properties. It shows the crystal structure in XRD. The transmission spectral properties of the ZnS:Co film are very prominent. The transmittance of the film is over 90% between 800 and 6000 nm. The XRD results show the crystalline structure of the film on sapphire substrates and the amorphous structure of the film on glass, which is reflected in the guidance effect of the substrates. The high temperature environment is conducive to the formation of crystals. The best electrical properties of film with 600 °C proposed in the experiment. The research results play a key role in the application of ZnS:Co materials. © 2020 Elsevier B.V.

Keyword:

Thin films X ray diffraction Zinc sulfide Substrates Film preparation II-VI semiconductors Optical properties Crystal structure Sapphire Pulsed laser deposition Glass Nanocrystalline materials

Author Community:

  • [ 1 ] [Gao, Dongwen]Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Wang, Li]Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Su, Xueqiong]Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Wang, Jin]Faculty of Science, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Chen, Ruixiang]Faculty of Science, Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address:

  • [wang, li]faculty of science, beijing university of technology, beijing; 100124, china

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Source :

Optical Materials

ISSN: 0925-3467

Year: 2021

Volume: 111

3 . 9 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:116

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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