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Author:

Miao, Yang (Miao, Yang.) | Qiu, Zaihui (Qiu, Zaihui.) | Jiang, Yuncheng (Jiang, Yuncheng.) | Zhang, Xiangyin (Zhang, Xiangyin.) | Han, Lei (Han, Lei.) | Wang, Zeng (Wang, Zeng.) | Wang, Ning (Wang, Ning.)

Indexed by:

EI Scopus SCIE

Abstract:

When a parallel light beam illuminates a curved air-liquid interface, a group of self-interference fringes appears in the reflection field in the region near the critical point. A model describing the interface height and slope dependences on the fringe phase supports this observation. The fringe phase function is determined by the fringe image. The height, slope, and curvature of the interface curved by a glass slide and thin rod are measured. The resolution, for the curvature measuring, is up to 0.05 mu m(-1). A comparison of the experimental results of the interface height by using the exponential theory verifies this approach's reliability. A small RMS error shows that the results are in good agreement.

Keyword:

Interface Curvature Self-interference Fringes

Author Community:

  • [ 1 ] [Miao, Yang]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China
  • [ 2 ] [Qiu, Zaihui]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China
  • [ 3 ] [Miao, Yang]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Ping Le Yuan 100, Beijing 100, Peoples R China
  • [ 4 ] [Jiang, Yuncheng]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Ping Le Yuan 100, Beijing 100, Peoples R China
  • [ 5 ] [Zhang, Xiangyin]Beijing Univ Technol, Fac Informat Technol, Ping Le Yuan 100, Beijing 100, Peoples R China
  • [ 6 ] [Han, Lei]Beijing Univ Posts & Telecommun, Sch Automat, Xitucheng Rd 10, Beijing 100876, Peoples R China
  • [ 7 ] [Wang, Zeng]China Acad Launch Vehicle Technol, Inst 18, Beijing, Peoples R China
  • [ 8 ] [Wang, Ning]China Aerosp Sci & Technol Corp, Beijing, Peoples R China

Reprint Author's Address:

  • [Miao, Yang]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China

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Source :

OPTICS COMMUNICATIONS

ISSN: 0030-4018

Year: 2021

Volume: 497

2 . 4 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:72

JCR Journal Grade:3

Cited Count:

WoS CC Cited Count: 4

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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