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Abstract：
The soft breakdown (SBD) characteristic and self-heating effect (SHE) suppression of 400V SOI NLDMOSFETs after irradiation under different bias conditions is discovered through experiments. The mechanisms for these phenomena are analysed and confirmed by TCAD simulations.
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2018 18TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS)
ISSN： 0379-6566
Year： 2018
Page： 4-7
Language： English
Cited Count：
WoS CC Cited Count： 8
SCOPUS Cited Count： 4
ESI Highly Cited Papers on the List： 0 Unfold All
WanFang Cited Count：
Chinese Cited Count：
30 Days PV： 5
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