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Author:

石磊 (石磊.) | 冯士维 (冯士维.) (Scholars:冯士维) | 郭春生 (郭春生.) | 朱慧 (朱慧.) | 万宁 (万宁.)

Keyword:

recovery surface state trap high-electron mobility transistor

Author Community:

  • [ 1 ] [石磊]北京工业大学
  • [ 2 ] [冯士维]北京工业大学
  • [ 3 ] [郭春生]北京工业大学
  • [ 4 ] [朱慧]北京工业大学
  • [ 5 ] [万宁]北京工业大学

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Source :

中国物理B

Year: 2013

Issue: 2

Page: 415-418

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: -1

Chinese Cited Count:

30 Days PV: 7

Online/Total:892/10641993
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