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Author:

Jin, Dongyue (Jin, Dongyue.) | Yang, Shaomeng (Yang, Shaomeng.) | Zhang, Feng (Zhang, Feng.) | Wu, Ling (Wu, Ling.) | Guan, Baolu (Guan, Baolu.) | Yang, Yingqi (Yang, Yingqi.) | Zhang, Wanrong (Zhang, Wanrong.) (Scholars:张万荣)

Indexed by:

EI Scopus SCIE

Abstract:

This study investigates the thermal design of 2-D vertical-cavity surface-emitting laser (VCSEL) arrays for optical output power improvement. Considering the temperature dependencies of bias current, internal quantum efficiency, internal optical loss, and thermal resistance of each array cell, a compact electro-opto-thermal model of 2-D VCSEL arrays with linear power dissipation and quadratic power dissipation in each array cell is established to study the effects of array cell spacing and layout on the device performance. At the same time, the power dissipation mechanisms contributing to thermal rollover are also studied. It is found that the array cell spacing has a strong influence on the linear power dissipation, and the layout (such as hexagonal design) influences quadratic power dissipation obviously. With the careful design of array cell spacing and layout, both the temperature profile and the thermal resistance matrix of VCSEL arrays are improved, which is helpful to delay the onset of thermal rollover and hence enhance the optical output power. The simulation results are consistent with experimental results.

Keyword:

Resistance Vertical cavity surface emitting lasers Optical arrays power dissipation Rollover Power dissipation Power generation thermal design Electro-opto-thermal model thermal resistance matrix Thermal resistance vertical-cavity surface-emitting laser (VCSEL) arrays

Author Community:

  • [ 1 ] [Jin, Dongyue]Beijing Univ Technol, Fac Informat Technol, RFIC Lab, Beijing 100124, Peoples R China
  • [ 2 ] [Yang, Shaomeng]Beijing Univ Technol, Fac Informat Technol, RFIC Lab, Beijing 100124, Peoples R China
  • [ 3 ] [Wu, Ling]Beijing Univ Technol, Fac Informat Technol, RFIC Lab, Beijing 100124, Peoples R China
  • [ 4 ] [Yang, Yingqi]Beijing Univ Technol, Fac Informat Technol, RFIC Lab, Beijing 100124, Peoples R China
  • [ 5 ] [Zhang, Wanrong]Beijing Univ Technol, Fac Informat Technol, RFIC Lab, Beijing 100124, Peoples R China
  • [ 6 ] [Zhang, Feng]Beijing Univ Technol, Fac Informat Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China
  • [ 7 ] [Guan, Baolu]Beijing Univ Technol, Fac Informat Technol, Key Lab Optoelect Technol, Minist Educ, Beijing 100124, Peoples R China

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Source :

IEEE TRANSACTIONS ON ELECTRON DEVICES

ISSN: 0018-9383

Year: 2022

Issue: 7

Volume: 69

Page: 3761-3767

3 . 1

JCR@2022

3 . 1 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:49

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 10

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

Affiliated Colleges:

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