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Author:

Liu, Bo (Liu, Bo.) | Chang, Ying-Feng (Chang, Ying-Feng.) | Li, Juzhe (Li, Juzhe.) | Liu, Xu (Liu, Xu.) | Wang, Le An (Wang, Le An.) | Verma, Dharmendra (Verma, Dharmendra.) | Liang, Hanyuan (Liang, Hanyuan.) | Zhu, Hui (Zhu, Hui.) | Zhao, Yudi (Zhao, Yudi.) | Li, Lain-Jong (Li, Lain-Jong.) | Hou, Tuo-Hung (Hou, Tuo-Hung.) | Lai, Chao-Sung (Lai, Chao-Sung.)

Indexed by:

EI Scopus SCIE

Abstract:

The fast development of the Internet of things (IoT) promises to deliver convenience to human life. However, a huge amount of the data is constantly generated, transmitted, processed, and stored, posing significant security challenges. The currently available security protocols and encryption techniques are mostly based on software algorithms and pseudorandom number generators that are vulnerable to attacks. A true random number generator (TRNG) based on devices using stochastically physical phenomena has been proposed for auditory data encryption and trusted communication. In the current study, a Bi2O2Se-based memristive TRNG is demonstrated for security applications. Compared with traditional metal-insulator-metal based memristors, or other two-dimensional material-based memristors, the Bi2O2Se layer as electrode with non-van der Waals interface, high carrier mobility, air stability, extreme low thermal conductivity, as well as vertical surface resistive switching shows intrinsic stochasticity and complexity in a memristive true analogue/digital random number generation. Moreover, those analogue/digital random number generation processes are proved to be resilient for machine learning prediction.

Keyword:

Shapley value long short-term memory Bi2O2Se random telegraph noise memristor true random number generator Diffie-Hellman key exchange

Author Community:

  • [ 1 ] [Chang, Ying-Feng]Chang Gung Univ, Artificial Intelligence Res Ctr, Taoyuan 33302, Taiwan
  • [ 2 ] [Lai, Chao-Sung]Chang Gung Univ, Artificial Intelligence Res Ctr, Taoyuan 33302, Taiwan
  • [ 3 ] [Liu, Bo]Beijing Univ Technol, Fac Informat Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 4 ] [Li, Juzhe]Beijing Univ Technol, Fac Informat Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 5 ] [Liu, Xu]Beijing Univ Technol, Fac Informat Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 6 ] [Wang, Le An]Beijing Univ Technol, Fac Informat Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 7 ] [Zhu, Hui]Beijing Univ Technol, Fac Informat Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 8 ] [Verma, Dharmendra]Chang Gung Univ, Dept Elect Engn, Taoyuan 33302, Taiwan
  • [ 9 ] [Lai, Chao-Sung]Chang Gung Univ, Dept Elect Engn, Taoyuan 33302, Taiwan
  • [ 10 ] [Liang, Hanyuan]Penn State Univ, Sch Elect Engn & Comp Sci, University Pk, PA 16801 USA
  • [ 11 ] [Zhao, Yudi]Beijing Informat Sci & Technol Univ, Sch Informat & Commun Engn, Beijing 100101, Peoples R China
  • [ 12 ] [Li, Lain-Jong]Univ Hong Kong, Dept Mech Engn, Hong Kong 999077, Peoples R China
  • [ 13 ] [Hou, Tuo-Hung]Natl Yang Ming Chiao Tung Univ, Dept Elect Engn, Hsinchu 300, Taiwan
  • [ 14 ] [Hou, Tuo-Hung]Natl Yang Ming Chiao Tung Univ, Inst Elect, Hsinchu 300, Taiwan
  • [ 15 ] [Lai, Chao-Sung]Chang Gung Mem Hosp, Dept Nephrol, Linkou 33305, Taiwan
  • [ 16 ] [Lai, Chao-Sung]Ming Chi Univ Technol, Dept Mat Engn, New Taipei 24301, Taiwan

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Source :

ACS NANO

ISSN: 1936-0851

Year: 2022

Issue: 4

Volume: 16

Page: 6847-6857

1 7 . 1

JCR@2022

1 7 . 1 0 0

JCR@2022

ESI Discipline: CHEMISTRY;

ESI HC Threshold:53

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 34

SCOPUS Cited Count: 34

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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