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Author:

Sha, Yin (Sha, Yin.) | Xie, Hongyun (Xie, Hongyun.) | Xiang, Yang (Xiang, Yang.) | Ji, Ruilang (Ji, Ruilang.) | Zhu, Fu (Zhu, Fu.) | Shen, Xiaoting (Shen, Xiaoting.) | Na, Weicong (Na, Weicong.) | Jin, Dongyue (Jin, Dongyue.) | Zhang, Wanrong (Zhang, Wanrong.)

Indexed by:

EI Scopus SCIE

Abstract:

High-efficiency, high-speed phototransistors applicable in visible wavelength and the near-infrared regime are highly desirable for optical communication links utilized for data centers, high-performance computing, and laser radar application. To overcome the intrinsic weak absorption of silicon material and alleviate the compromise between efficiency and speed of the device, a SiGe/Si heterojunction phototransistor (HPT) with photon-trapping nanoholes is demonstrated in this article. With photon-trapping nanohole structures, the absorption efficiency of the HPT is greatly improved near the whole band ranging from 600- to 1000-nm wavelength compared to one without nanoholes. The responsivity of nanohole-assisted HPT is 25.69, 27.02, and 15.65 A/W at 650-, 850-, and 940-nm wavelength, exhibiting 85.22%, 192.42%, and 848.48% improvement compared with its counterpart without nanoholes. The thin base region also allows a high speed of the HPT with a transient response of 0.45 ns at 850-nm wavelength.

Keyword:

Heterojunction phototransistor Silicon Stimulated emission Photonics SiGe Nanoscale devices Absorption nanohole photon trapping Optical surface waves Phototransistors

Author Community:

  • [ 1 ] [Sha, Yin]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Xie, Hongyun]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Xiang, Yang]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Ji, Ruilang]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Zhu, Fu]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Shen, Xiaoting]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Na, Weicong]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 8 ] [Jin, Dongyue]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 9 ] [Zhang, Wanrong]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China

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Source :

IEEE TRANSACTIONS ON ELECTRON DEVICES

ISSN: 0018-9383

Year: 2022

Issue: 5

Volume: 69

Page: 2514-2520

3 . 1

JCR@2022

3 . 1 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:49

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 9

SCOPUS Cited Count: 11

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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