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Author:

Zhang, Haipeng (Zhang, Haipeng.) | Leng, Chengcai (Leng, Chengcai.) | Yan, Xiao (Yan, Xiao.) | Cai, Guorong (Cai, Guorong.) | Pei, Zhao (Pei, Zhao.) | Yu, Naigong (Yu, Naigong.) | Basu, Anup (Basu, Anup.)

Indexed by:

EI Scopus SCIE

Abstract:

Many methods have been developed to improve the performance of image registration. In this letter, we introduce a novel method based on a local affine constraint for remote sensing image registration, which can be widely used in image processing and pattern recognition. Our algorithm has three components. First, we exploit the scale invariant feature transform (SIFT) method to extract feature points and calculate the gradient magnitude to establish feature descriptors with a circular instead of square neighborhood. Second, an initial matching is implemented by the nearest neighbor distance ratio (NNDR) and the fast sample consensus (FSC) algorithm. Finally, fine registration is established using more correct matches obtained by the local affine transformation circular region search algorithm. Experimental results show that the proposed method achieves subpixel accuracy. In addition, both the correct matching rate and registration demonstrate the effectiveness and efficiency of our method.

Keyword:

scale invariant feature transform (SIFT) Image edge detection Robustness Image registration Histograms image registration Remote sensing Feature extraction Power capacitors

Author Community:

  • [ 1 ] [Zhang, Haipeng]Nanchang Hangkong Univ, Sch Math & Informat Sci, Nanchang 330063, Peoples R China
  • [ 2 ] [Leng, Chengcai]Northwest Univ, Sch Math, Xian 710127, Peoples R China
  • [ 3 ] [Yan, Xiao]Nanjing Univ Sci & Technol, Sch Automat, Nanjing 210094, Peoples R China
  • [ 4 ] [Cai, Guorong]Jimei Univ, Coll Comp Engn, Xiamen 361021, Peoples R China
  • [ 5 ] [Pei, Zhao]Shaanxi Normal Univ, Sch Comp Sci, Xian 710119, Peoples R China
  • [ 6 ] [Yu, Naigong]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Basu, Anup]Univ Alberta, Dept Comp Sci, Edmonton, AB T6G 2E8, Canada

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Source :

IEEE GEOSCIENCE AND REMOTE SENSING LETTERS

ISSN: 1545-598X

Year: 2022

Volume: 19

4 . 8

JCR@2022

4 . 8 0 0

JCR@2022

ESI Discipline: GEOSCIENCES;

ESI HC Threshold:38

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 18

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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