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Author:

Kong, Weichen (Kong, Weichen.) | Ma, Shuaifeng (Ma, Shuaifeng.) | Dai, Yanwei (Dai, Yanwei.) | Liu, Yinghua (Liu, Yinghua.)

Indexed by:

EI Scopus SCIE

Abstract:

Understanding the notch tip field of sharp V-notch under creeping conditions is a serious concern and a prerequisite to evaluate the fracture and fatigue issues for notched components bearing creeping loading. In this paper, the plane stress sharp V-notch tip field is studied by asymptotic analysis. The eigenvalues such as singularity and angular distribution functions are presented and discussed through the asymptotic solution. By comparing the asymptotic solution with the finite element solution, the asymptotic solution shows good agreement. Compared with the plane strain asymptotic solution for sharp V-notch tip, the plane stress asymptotic solution with the leading term may be sufficient to characterize the notch tip stress field. The difference between plane stress asymptotic solution and plane strain asymptotic solution is also discussed. The solution given in this paper could provide a theoretical foundation for the evaluation of plane stress sharp V-notch tip field under creep conditions. © 2022 Elsevier Ltd

Keyword:

Strain Stress analysis Eigenvalues and eigenfunctions Stress intensity factors Angular distribution Asymptotic analysis

Author Community:

  • [ 1 ] [Kong, Weichen]Department of Engineering Mechanics, AML, Tsinghua University, Beijing; 100084, China
  • [ 2 ] [Ma, Shuaifeng]Department of Engineering Mechanics, AML, Tsinghua University, Beijing; 100084, China
  • [ 3 ] [Dai, Yanwei]Institute of Electronics Packaging Technology and Reliability, Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Liu, Yinghua]Department of Engineering Mechanics, AML, Tsinghua University, Beijing; 100084, China

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Source :

Engineering Fracture Mechanics

ISSN: 0013-7944

Year: 2022

Volume: 273

5 . 4

JCR@2022

5 . 4 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:49

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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