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Author:

Hu, Zhifu (Hu, Zhifu.) | Na, Weicong (Na, Weicong.) | He, Meilin (He, Meilin.) | He, Ruicong (He, Ruicong.) | Li, Jiahui (Li, Jiahui.) | Zhang, Qijun (Zhang, Qijun.) | Ma, Kaixue (Ma, Kaixue.)

Indexed by:

EI Scopus SCIE

Abstract:

GaN HEMT switches has become more and more important in RF front-end. This article proposes a circuit-based neuro-SM technique for the small-signal modeling of multi-gate GaN HEMT switches for the first time. A general equivalent circuit model for multi-gate switch HEMT is proposed using the cascaded single-gate switch HEMT model to represent the tendency rather than the exact behaviors of the small-signal responses. We utilize this proposed equivalent circuit model as the coarse model and propose a novel circuit-based neuro-SM modeling technique. Neural networks are incorporated to learn the difference between the coarse model and the fine device data, improving the neuro-SM model accuracy. After being trained, the obtained neuro-SM model can be used for high-level circuit design to increase the speed and accuracy of circuit design. Compared to the existing modeling techniques for multi-gate switches, the proposed neuro-SM achieves better model accuracy. Examples of a dual-gate GaN HEMT switch and a triple-gate GaN HEMT switch have been examined.

Keyword:

high-electron-mobility transistor (HEMT) switch gallium nitride (GaN) modeling neuro-space mapping (neuro-SM)

Author Community:

  • [ 1 ] [Hu, Zhifu]Tianjin Univ, Sch Microelect, Tianjin, Peoples R China
  • [ 2 ] [Zhang, Qijun]Tianjin Univ, Sch Microelect, Tianjin, Peoples R China
  • [ 3 ] [Ma, Kaixue]Tianjin Univ, Sch Microelect, Tianjin, Peoples R China
  • [ 4 ] [Na, Weicong]Beijing Univ Technol, Fac Informat Technol, Beijing, Peoples R China
  • [ 5 ] [Li, Jiahui]Beijing Univ Technol, Fac Informat Technol, Beijing, Peoples R China
  • [ 6 ] [He, Meilin]Hebei Semicond Res Inst, Dept Device Design & Charactizat, Shijiazhuang, Hebei, Peoples R China
  • [ 7 ] [He, Ruicong]Hebei Semicond Res Inst, Dept Device Design & Charactizat, Shijiazhuang, Hebei, Peoples R China

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Source :

INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING

ISSN: 1096-4290

Year: 2022

Issue: 11

Volume: 32

1 . 7

JCR@2022

1 . 7 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:49

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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