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Author:

Jin, M. (Jin, M..) | Zhang, X. (Zhang, X..) | Liu, X. (Liu, X..) | Liang, C. (Liang, C..) | Liu, J. (Liu, J..) | Hu, Z. (Hu, Z..) | Li, K. (Li, K..) | Wang, G. (Wang, G..) | Yang, J. (Yang, J..) | Zhu, L. (Zhu, L..) | Li, G. (Li, G..)

Indexed by:

EI Scopus SCIE

Abstract:

The single-beam magneto-optical trap (MOT) based on the diffractive optical element offers a new route to develop compact cold atom sources. However, the optical efficiency in the previous single-beam MOT systems is usually low and unbalanced, which will affect the quality of the trapped atoms. To solve this issue, we developed a centimeter-scale dielectric metasurface optical chip with dynamic phase distributions, which was used to split a single incident laser beam into five separate ones with well-defined polarization states and uniform energy distributions. The measured diffraction efficiency of the metasurface is up to 47%. A single-beam MOT integrated with the metasurface optical chip was then used to trap the 87Rb atoms with numbers ∼1.4 × 108 and temperatures ∼7.0 μK. The proposed concept in this work may provide a promising solution for developing ultracompact cold atom sources. © 2023 American Chemical Society.

Keyword:

cold atom diffractive optical element dielectric metasurface magneto-optical trap

Author Community:

  • [ 1 ] [Jin M.]Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, 518055, China
  • [ 2 ] [Zhang X.]College of Intelligence Science and Technology, National University of Defense Technology, Changsha, 410073, China
  • [ 3 ] [Zhang X.]Interdisciplinary Center for Quantum Information, National University of Defense Technology, Changsha, 410073, China
  • [ 4 ] [Liu X.]Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, 518055, China
  • [ 5 ] [Liu X.]Institute of Laser Engineering, Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [Liang C.]College of Intelligence Science and Technology, National University of Defense Technology, Changsha, 410073, China
  • [ 7 ] [Liang C.]Interdisciplinary Center for Quantum Information, National University of Defense Technology, Changsha, 410073, China
  • [ 8 ] [Liu J.]College of Intelligence Science and Technology, National University of Defense Technology, Changsha, 410073, China
  • [ 9 ] [Liu J.]Interdisciplinary Center for Quantum Information, National University of Defense Technology, Changsha, 410073, China
  • [ 10 ] [Hu Z.]Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, 518055, China
  • [ 11 ] [Li K.]Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, 518055, China
  • [ 12 ] [Wang G.]College of Intelligence Science and Technology, National University of Defense Technology, Changsha, 410073, China
  • [ 13 ] [Wang G.]Interdisciplinary Center for Quantum Information, National University of Defense Technology, Changsha, 410073, China
  • [ 14 ] [Yang J.]College of Intelligence Science and Technology, National University of Defense Technology, Changsha, 410073, China
  • [ 15 ] [Yang J.]Interdisciplinary Center for Quantum Information, National University of Defense Technology, Changsha, 410073, China
  • [ 16 ] [Zhu L.]College of Intelligence Science and Technology, National University of Defense Technology, Changsha, 410073, China
  • [ 17 ] [Zhu L.]Interdisciplinary Center for Quantum Information, National University of Defense Technology, Changsha, 410073, China
  • [ 18 ] [Li G.]Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, 518055, China

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Source :

Nano Letters

ISSN: 1530-6984

Year: 2023

Issue: 9

Volume: 23

Page: 4008-4013

1 0 . 8 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:17

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 15

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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