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Author:

Sun, Zhiming (Sun, Zhiming.) | Gao, Yuhang (Gao, Yuhang.) | Ban, Chaogang (Ban, Chaogang.) | Meng, Jiazhi (Meng, Jiazhi.) | Wang, Jinshu (Wang, Jinshu.) | Wang, Kaiwen (Wang, Kaiwen.) | Gan, Liyong (Gan, Liyong.)

Indexed by:

EI Scopus SCIE

Abstract:

Oxygen vacancy (V-o) engineering is a powerful tool to improve semiconductor metal oxide-based surface-enhanced Raman scattering (SERS) activity due to the enriched surface states of substrates. However, the current energy-consuming high temperature hydrogen reduction methods of introducing V-o and the poor sensitivity impede practical applications of semiconductor SERS. In this work, a facile solvothermal method was developed to prepare ultrafine WO3-x nanorods (similar to 3 nm width) for highperformance SERS substrates. The lowest detection limit of the rhodamine 6G (R6G) molecule on the Vo substrate can be as low as 10(-10) mol/L and exceeds that of unmodified WO3 by more than two orders of magnitude. Experimental and calculated results suggest that the V-o-induced localized surface plasmon resonance (LSPR), diverse vibronic coupling, and enhanced charge transfer synergistically account for this outstanding activity. These findings can provide insights into the rational design of oxygen vacancy tailored semiconductor SERS substrates.

Keyword:

oxygen vacancy surface-enhanced Raman scattering LSPR 3 nm-wide WO3-x charge transfer

Author Community:

  • [ 1 ] [Sun, Zhiming]Beijing Univ Technol, Beijing Key Lab, Beijing 100124, Peoples R China
  • [ 2 ] [Gao, Yuhang]Beijing Univ Technol, Beijing Key Lab, Beijing 100124, Peoples R China
  • [ 3 ] [Wang, Kaiwen]Beijing Univ Technol, Beijing Key Lab, Beijing 100124, Peoples R China
  • [ 4 ] [Sun, Zhiming]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 5 ] [Gao, Yuhang]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 6 ] [Wang, Kaiwen]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 7 ] [Ban, Chaogang]Chongqing Univ, Coll Phys, Chongqing 401331, Peoples R China
  • [ 8 ] [Meng, Jiazhi]Chongqing Univ, Coll Phys, Chongqing 401331, Peoples R China
  • [ 9 ] [Gan, Liyong]Chongqing Univ, Coll Phys, Chongqing 401331, Peoples R China
  • [ 10 ] [Ban, Chaogang]Chongqing Univ, Ctr Quantum Mat & Devices, Chongqing 401331, Peoples R China
  • [ 11 ] [Meng, Jiazhi]Chongqing Univ, Ctr Quantum Mat & Devices, Chongqing 401331, Peoples R China
  • [ 12 ] [Gan, Liyong]Chongqing Univ, Ctr Quantum Mat & Devices, Chongqing 401331, Peoples R China
  • [ 13 ] [Wang, Jinshu]Tianjin Univ Tradit Chinese Med, Sch Publ Hlth & Hlth Sciences, Tianjin 301617, Peoples R China

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Source :

ACS APPLIED NANO MATERIALS

Year: 2023

Issue: 10

Volume: 6

Page: 8635-8642

5 . 9 0 0

JCR@2022

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 10

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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