• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

Dai, Y. (Dai, Y..) | Zhao, L. (Zhao, L..) | Zan, Z. (Zan, Z..) | Qin, F. (Qin, F..)

Indexed by:

EI Scopus SCIE

Abstract:

When it comes to electronics packaging, measuring the fracture toughness of adhesive materials is critical. Our research involved conducting double cantilever beam (DCB) tests to study the behavior of sintered silver in mode I fracture, which is doped with different weights of nickel-coated multiwall carbon nanotube additives. The results showed that when the sintered silver DCB adhesive joints contained 0.5 wt% nanofiller, their mode I fracture toughness increased to 0.0701 N/mm. This represents an 89.97 % improvement over the fracture toughness of sintered silver without nanofiller additives. The nickel-coated multiwall carbon nanotube nanofillers influenced both the microstructure characteristics and the propagation path of cracks in sintered silver. We used an inverse method to present cohesive zone models of sintered silver with varying nanofiller contents. The representative mode I resistance curves of sintered silver with different contents of nanofiller are also presented and discussed. The results of our study can help increase the reliability and strengthen the mode I fracture resistance for the sintered silver interconnection bonding layer by adding an appropriate nanofiller. © 2024 Elsevier Ltd

Keyword:

Mode I fracture toughness Sintered silver Nickel coated multiwall carbon nanotubes Double cantilever beam test

Author Community:

  • [ 1 ] [Dai Y.]Institute of Electronics Packaging Technology and Reliability, Department of Mechanics, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Dai Y.]Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Zhao L.]Institute of Electronics Packaging Technology and Reliability, Department of Mechanics, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Zan Z.]Institute of Electronics Packaging Technology and Reliability, Department of Mechanics, Beijing University of Technology, Beijing, 100124, China
  • [ 5 ] [Qin F.]Institute of Electronics Packaging Technology and Reliability, Department of Mechanics, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [Qin F.]Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, 100124, China

Reprint Author's Address:

Email:

Show more details

Related Keywords:

Source :

Materials Science in Semiconductor Processing

ISSN: 1369-8001

Year: 2024

Volume: 174

4 . 1 0 0

JCR@2022

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

Affiliated Colleges:

Online/Total:704/10590083
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.