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Author：

Fan, J. (Fan, J..) | Li, W. (Li, W..) | Zhou, Q. (Zhou, Q..) | Yang, G. (Yang, G..) | Tang, P. (Tang, P..) | He, J. (He, J..) | Ma, L. (Ma, L..) | Zhang, J. (Zhang, J..) | Xiao, J. (Xiao, J..) | Yan, Z. (Yan, Z..) | Li, A. (Li, A..) | Han, X. (Han, X..)

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Scopus

Abstract：

This　review　discusses　the　utilization　of　metal　halide　perovskite　(MHP)　materials　in　X-ray　direct　imaging　detectors　for　medical　application.　Compared　to　traditional　semiconductors,　MHP　has　multiple　advantages　including　high　linear　attenuation　coefficient,　low　exciton　binding　energy,　long　carrier　diffusion　length,　and　high　carrier　mobility.　These　ascendancies　allow　for　low-dose　and　high-resolution　medical　imaging.　Apartment　from　a　historical　overview　of　the　develop-X-ray　direct　imaging　detectors　and　their　performance　indicators,　this　review　specifically　focuses　on　the　development　and　innovation　of　X-ray　direct　imaging　detectors　using　MHP　materials.　The　article　concludes　by　identifying　existing　challenges　and　discussing　the　potential　application　of　perovskite　X-ray　direct　imaging　detectors　in　the　medical　industry.　©　2024　Wiley-VCH　GmbH.

Keyword：

medical imaging x-ray direct detector perovskite

Author Community：

  • [ 1 ] [Fan J.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Li W.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Zhou Q.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Yang G.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 5 ] [Tang P.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [He J.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 7 ] [Ma L.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 8 ] [Zhang J.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 9 ] [Xiao J.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 10 ] [Yan Z.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 11 ] [Li A.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China
  • [ 12 ] [Han X.]College of Materials Science and Engineering, Beijing Key Lab of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, 100124, China

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Source ：

Advanced Functional Materials

ISSN： 1616-301X

Year： 2024

1 9 . 0 0 0

JCR@2022

Cited Count：

WoS CC Cited Count：

SCOPUS Cited Count： 4

ESI Highly Cited Papers on the List： 0 Unfold All

WanFang Cited Count：

Chinese Cited Count：

30 Days PV： 10

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