Upon　98%　reduction　cold-rolling,　a　single　layer　AA3003　foil　material　of　115　mu　m　thick　was　intermediately　annealed　at　300-420　degrees　C/1-8　h,　and　the　preferred　temperature　and　time　of　the　intermediate　annealing　for　the　laminated　AA4343/AA3003/AA4343　composite　foil　material　were　determined.　All　of　these　samples　were　cold　rolled　by　40%　to　70　mu　m　thick　and　finally　annealed　at　a　temperature　in　the　range　of　300-550　degrees　C　for　1-9　h.　Their　sagging　resistance　and　microstructure　were　investigated　using　simulated　brazing　treatment,　optical　microscopy　(OM),　scanning　electron　microscopy　(SEM)　and　transmission　electron　microscopy　(TEM).　For　the　single　layer　AA3003　foil,　the　sagging　distance　decreased　first　and　then　increased　with　increasing　intermediate　annealing　temperature,　and　the　lowest　sagging　distance　corresponds　to　the　coarsest　grain　in　the　recrystallized　sample.　After　the　final　annealing　for　the　single　layer,　the　sagging　distance　decreased　monotonously.　For　the　laminated　foil　subjected　to　the　final　annealing,　the　sagging　distance　curves　decreased　first　and　then　increased　with　increasing　annealing　temperature　and　time.　The　improvement　of　sagging　resistance　was　attributed　to　the　recovery　of　two　types　of　materials　during　annealing　process.　The　deterioration　of　the　sagging　resistance　in　the　laminated　foils　was　due　to　the　corrosion　in　the　brazing　process,　resulted　from　the　Si　diffusion　from　the　cladding　layer　into　the　core　layer.　It　is　the　coarse　grains,　few　dislocations　and　minimal　diffusion　of　Si　that　are　crucial　for　improving　the　sagging　resistance　of　the　laminated　foils.