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Author:

Liu, Shuang (Liu, Shuang.) | Ma, Limin (Ma, Limin.) | Zhen, Cheng (Zhen, Cheng.) | Guo, Fu (Guo, Fu.)

Indexed by:

CPCI-S EI

Abstract:

Brittle Cu-Sn intermetallic compounds (I1VIC5) are detrimental to the serviceability of solder joints. Cobalt-phosphorus (Co -P) is a coating choice with good diffusion barrier properties. In this work, Co -P coatings with 4 at.% and 15 at.% P content representing crystalline and amorphous were electroplated onto the Cu pad surface, and formed Cu/Co-P/Sn-Ag/Co-P/Cu joints by soldering. Thermal shock test was carried out for 250 cycles in the range of -50 degrees C to 150 C, each cycle was 30 minutes. Under mechanical and thermal fatigue loading, fatigue cracks appeared at the interface of Cu/Co-4 at. /0 P/Sn-Ag/Co-4 at. /0 P/Cu, while the interface of Cu/Co-15 at. /0 P/Sn-Ag/Co-15 at.% P/Cu joint can keep basically stable. This work reveals the IMCs evolution of solder joints containing crystalline/amorphous Co -P coatings during mechanical-thermal fatigue. Combining the analysis of nanoindentation test results, it is found that the amorphous structure of the Co -15 at.% P coating leads to a low-hardness Co-Sn IMCs, which is the key to maintaining the stability of the joint interface. The soft Co-Sn IMCs bear a large amount of plastic deformation in the fatigue load, and improve the mechanical properties of the solder joint interface.

Keyword:

plating diffusion cobalt-phosphorus intermetallic compound thermal fatigue soldering

Author Community:

  • [ 1 ] [Liu, Shuang]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China
  • [ 2 ] [Ma, Limin]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China
  • [ 3 ] [Zhen, Cheng]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China
  • [ 4 ] [Guo, Fu]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China

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Source :

2023 24TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT

ISSN: 2836-9734

Year: 2023

Cited Count:

WoS CC Cited Count:

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ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 0

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