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Author:

Qiao, X. (Qiao, X..) | Miao, Y. (Miao, Y..) | Zhang, X. (Zhang, X..) | Shen, H. (Shen, H..) | Hua, Y. (Hua, Y..) | Sun, L. (Sun, L..) | Huang, Y. (Huang, Y..) | Xu, J. (Xu, J..) | Wu, D. (Wu, D..)

Indexed by:

EI Scopus SCIE

Abstract:

The O-ring made of nitrile rubber (NBR) is widely used in high-pressure hydrogen storage systems due to its excellent sealing characteristics. The sealing performance of the O-ring is directly related to the safety of the high-pressure hydrogen storage system. The stress and strain at the sealing interface are key factors in evaluating the sealing performance. Under extreme conditions, excessive stress and strain is also the reason for the failure of rubber materials. Prolonged exposure to high-pressure hydrogen gas can cause hydrogen permeation in O-rings, altering the stress distribution at the sealing interface. The paper establishes an analytical function model based on the modified hyperelastic effective modulus for the distribution of hydrogen pressure and stress on the sealing surface, revealing the stress extremum and stress distribution at the sealing interface under hydrogen permeation of the sealing ring. The paper proposes the influence of hydrogen concentration on hydrogen-induced strain in O-rings, refining the composition of strain in O-rings under hydrogen permeation. By comparing the analytical model with the simulation model, the correctness and effectiveness of the analytical model were validated, while the accuracy of the simulation model was verified through experimental data from Kyushu University in Japan. The paper proposes two indices, S-hpsd (Skewness Coefficient of Hydrogen Permeation Stress Distribution) and K-hpsd (Kurtosis Coefficient of Hydrogen Permeation Stress Distribution), to describe the stress distribution at the sealing interface in Hydrogen Permeation environments. The results indicate that under the same compression ratio, the higher the hydrogen pressure within 0 MPa–70 MPa, the greater the normal stress at the sealing interface. The stress distribution at the sealing interface changes from U-shaped to V-shaped, with both S-hpsd and K-hpsd gradually increasing. The kurtosis coefficient of hydrogen permeation stress distribution increases significantly. Under the same hydrogen pressure, within the range of 8%–20%, the higher the compression ratio, the higher the normal stress at the sealing interface. As the shape changes from U-type to V-type, both S-hpsd and K-hpsd gradually decrease. The research findings of this study can provide references and theoretical support for maintenance strategies and failure prevention of O-ring seals in hydrogen fuel cell vehicles. © 2025

Keyword:

Analytical model Maintenance strategy Performance degradation Hydrogen permeation Mechanical engineering O-ring seal

Author Community:

  • [ 1 ] [Qiao X.]College of Mechanical & Energy Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Miao Y.]College of Mechanical & Energy Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Miao Y.]Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology Beijing, 100124, China
  • [ 4 ] [Zhang X.]College of Mechanical & Energy Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 5 ] [Shen H.]Tsinghua University, Beijing, 100084, China
  • [ 6 ] [Hua Y.]Xinxing Cathay International Intelligent Equipment Technology Research Institute Co., Ltd, China
  • [ 7 ] [Sun L.]School of Microelectronics, Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices, Xidian University, Xi'an, 710071, China
  • [ 8 ] [Huang Y.]Zhen-O Co.Ltd, China
  • [ 9 ] [Xu J.]College of Engineering Science and Technology, Shanghai Ocean University, China
  • [ 10 ] [Wu D.]College of Engineering Science and Technology, Shanghai Ocean University, China

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Source :

International Journal of Hydrogen Energy

ISSN: 0360-3199

Year: 2025

Volume: 109

Page: 164-173

7 . 2 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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