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Author:

Wang, Xu (Wang, Xu.) | Yang, Hongyan (Yang, Hongyan.) | Yuan, Ying (Yuan, Ying.) | Wu, Wuchen (Wu, Wuchen.) (Scholars:吴武臣)

Indexed by:

EI Scopus CSCD

Abstract:

A low noise multi-channel readout integrated circuit (IC) which converts a detector current to analog voltage for X-ray cargo inspection is described. The readout IC provides 32 channels of a circuit having a maximum dynamic range of 15 bit and is comprised of integrator gain selection, timing generator, shift register chain, integrator array, sample/hold (S/H) stage amplifier etc. It was fabricated using 0.6 μm standard CMOS process, and occupies a die area of 2.7 × 13.9 mm2. It operates at 1 MHz, consumes 100 mW from a 5 V supply and 4.096 V as reference, and has a measured output noise of 85 μ Vrms on 63 pF of integrator gain capacitance and 440 pF of photodiode terminal capacitance so that steel plate penetration thickness can reach more than 400 mm. © 2013 Chinese Institute of Electronics.

Keyword:

CMOS integrated circuits Shift registers X rays Capacitance Inspection

Author Community:

  • [ 1 ] [Wang, Xu]VLSI and System Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Yang, Hongyan]VLSI and System Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Yuan, Ying]VLSI and System Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Wu, Wuchen]VLSI and System Laboratory, College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100022, China

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Source :

Journal of Semiconductors

ISSN: 1674-4926

Year: 2013

Issue: 4

Volume: 34

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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